As the complexity of designs
increases and technology scales down into the deep-submicron domain, the
probability of malfunctions and failures in the networks-on-chip (NoCs)
components increases. In this work, we focus on the study and evaluation of
techniques for increasing reliability and resilience of network interfaces
(NIs) within NoC-based multiprocessor system-on-chip architectures. NIs act as
interfaces between intellectual property cores and the communication
infrastructure; the faulty behavior of one of them could affect, therefore, the
overall system. In this work, we propose a functional fault model for the NI
components by evaluating their susceptibility to faults. We present a two-level
fault-tolerant solution that can be employed for mitigating the effects of both
permanent and temporary faults in the NI. Experimental simulations show that
with a limited overhead, we can obtain an NI reliability comparable to the one
obtainable by implementing the system by using standard triple modular
redundancy techniques, while saving up to 48 percent in area, as well as
obtaining a significant energy reduction
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